Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling

Keiji Hosotani; Makoto Nagamine; Hisanori Aikawa; Naoharu Shimomura; Masahiko Nakayama; Tadashi Kai; Sumio Ikegawa; Yoshiaki Asao; Hiroaki Yoda; Akihiro Nitayama

doi:10.1109/RELPHY.2008.4558997

Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling

Keiji Hosotani, Makoto Nagamine, Hisanori Aikawa, Naoharu Shimomura, Masahiko Nakayama, Tadashi Kai, Sumio Ikegawa, Yoshiaki Asao, Hiroaki Yoda, Akihiro Nitayama

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Citations (Scopus)

Original language	English
Title of host publication	46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS
Pages	703-704
Number of pages	2
DOIs	https://doi.org/10.1109/RELPHY.2008.4558997
Publication status	Published - 2008
Externally published	Yes
Event	46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS - Phoenix, AZ, United States Duration: 2008 Apr 27 → 2008 May 1

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
ISSN (Print)	1541-7026

Other

Other	46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS
Country/Territory	United States
City	Phoenix, AZ
Period	08/4/27 → 08/5/1

ASJC Scopus subject areas

Engineering(all)

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10.1109/RELPHY.2008.4558997

Cite this

Hosotani, K., Nagamine, M., Aikawa, H., Shimomura, N., Nakayama, M., Kai, T., Ikegawa, S., Asao, Y., Yoda, H., & Nitayama, A. (2008). Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling. In 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS (pp. 703-704). [4558997] (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/RELPHY.2008.4558997

Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling. / Hosotani, Keiji; Nagamine, Makoto; Aikawa, Hisanori; Shimomura, Naoharu; Nakayama, Masahiko; Kai, Tadashi; Ikegawa, Sumio; Asao, Yoshiaki; Yoda, Hiroaki; Nitayama, Akihiro.

46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. 2008. p. 703-704 4558997 (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hosotani, K, Nagamine, M, Aikawa, H, Shimomura, N, Nakayama, M, Kai, T, Ikegawa, S, Asao, Y, Yoda, H & Nitayama, A 2008, Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling. in 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS., 4558997, IEEE International Reliability Physics Symposium Proceedings, pp. 703-704, 46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS, Phoenix, AZ, United States, 08/4/27. https://doi.org/10.1109/RELPHY.2008.4558997

Hosotani K, Nagamine M, Aikawa H, Shimomura N, Nakayama M, Kai T et al. Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling. In 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. 2008. p. 703-704. 4558997. (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/RELPHY.2008.4558997

Hosotani, Keiji ; Nagamine, Makoto ; Aikawa, Hisanori ; Shimomura, Naoharu ; Nakayama, Masahiko ; Kai, Tadashi ; Ikegawa, Sumio ; Asao, Yoshiaki ; Yoda, Hiroaki ; Nitayama, Akihiro. / Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling. 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. 2008. pp. 703-704 (IEEE International Reliability Physics Symposium Proceedings).

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title = "Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling",

author = "Keiji Hosotani and Makoto Nagamine and Hisanori Aikawa and Naoharu Shimomura and Masahiko Nakayama and Tadashi Kai and Sumio Ikegawa and Yoshiaki Asao and Hiroaki Yoda and Akihiro Nitayama",

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AU - Hosotani, Keiji

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AU - Kai, Tadashi

AU - Ikegawa, Sumio

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AU - Yoda, Hiroaki

AU - Nitayama, Akihiro

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T3 - IEEE International Reliability Physics Symposium Proceedings

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BT - 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS

T2 - 46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS

Y2 - 27 April 2008 through 1 May 2008

ER -

Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling

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ASJC Scopus subject areas

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