Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling

Keiji Hosotani, Makoto Nagamine, Hisanori Aikawa, Naoharu Shimomura, Masahiko Nakayama, Tadashi Kai, Sumio Ikegawa, Yoshiaki Asao, Hiroaki Yoda, Akihiro Nitayama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)
Original languageEnglish
Title of host publication46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS
Pages703-704
Number of pages2
DOIs
Publication statusPublished - 2008 Sep 17
Event46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS - Phoenix, AZ, United States
Duration: 2008 Apr 272008 May 1

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Other

Other46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS
CountryUnited States
CityPhoenix, AZ
Period08/4/2708/5/1

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Hosotani, K., Nagamine, M., Aikawa, H., Shimomura, N., Nakayama, M., Kai, T., Ikegawa, S., Asao, Y., Yoda, H., & Nitayama, A. (2008). Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling. In 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS (pp. 703-704). [4558997] (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/RELPHY.2008.4558997