Residual stress measurement of an EB-PVD Y2O3-ZrO2 thermal barrier coating by micro-Raman spectroscopy

M. Tanaka, R. Kitazawa, T. Tomimatsu, Y. F. Liu, Y. Kagawa

Research output: Contribution to journalArticlepeer-review

36 Citations (Scopus)

Abstract

Residual stress distribution in an EB-PVD 4 mol% Y2O3-ZrO2 thermal barrier coating (TBC) layer coated on a superalloy substrate has been measured by micro-Raman spectroscopy. Piezo-spectroscopic coefficient was independently calibrated on a freestanding TBC layer. The coefficient for uniaxial stress is Πuni = 5.43 cm- 1GPa- 1. The stress measurement through the TBC thickness shows compressive stress distribution from small to an almost large constant value. Such a distribution agrees with theoretical consideration since the small stress correctly reflects the free edge effect and the large constant stress is closely related to TBC bulk stresses.

Original languageEnglish
Pages (from-to)657-660
Number of pages4
JournalSurface and Coatings Technology
Volume204
Issue number5
DOIs
Publication statusPublished - 2009 Dec 15

Keywords

  • Piezo-spectroscopic coefficient
  • Raman spectroscopy
  • Stress measurement
  • Thermal barrier coating
  • YO-ZrO

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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