Abstract
We have reproducibly fabricated suspended tungsten electrodes with a gap of less than 2 nm on a suspended silicon nitride membrane with a slit. Our fabrication technique is based on the local deposition of tungsten by a focused ion beam. The length of the nanogap between the electrodes was controlled by detecting a tunneling current during the growth of the tungsten electrodes from both sides of the slit. The gap length can reach about 1 nm, which corresponds to the size of a single molecule such as a fullerene.
Original language | English |
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Pages (from-to) | 1471-1473 |
Number of pages | 3 |
Journal | Microelectronic Engineering |
Volume | 83 |
Issue number | 4-9 SPEC. ISS. |
DOIs | |
Publication status | Published - 2006 Apr |
Keywords
- Focused ion beam
- Nanoelectrode
- Single molecule
- Tunneling current
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering