Remaining problems in the combined XPS/UPS/FES System

H. Yamaguchi, S. Nozue, R. Muraoka, Y. Kudo, T. Masuzawa, T. Yamada, M. Kudo, Y. Takakuwa, W. J. Chun, K. Okano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationTechnical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009
Pages73-74
Number of pages2
DOIs
Publication statusPublished - 2009
Event2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009 - Hamamatsu, Japan
Duration: 2009 Jul 202009 Jul 24

Publication series

NameTechnical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009

Other

Other2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009
CountryJapan
CityHamamatsu
Period09/7/2009/7/24

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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