TY - GEN
T1 - Reliability of high power MQW-DFB-DC-PBH-LDs for coherent optical communication system application
AU - Kitamura, M.
AU - Yamazaki, H.
AU - Yamada, H.
AU - Takano, S.
AU - Kosuge, K.
AU - Yamaguchi, M.
AU - Mito, I.
N1 - Publisher Copyright:
© 1992 Institute of Electrical and Electronics Engineers Inc. All rights reserved.
PY - 1992
Y1 - 1992
N2 - Result of aging test for 1.55μm MQW-DFB-DC-PBH-LDs, in terms of spectral linewidth, FM characteristics and lasing wavelength, is reported. Over 105 hours reliability was estimated from long term aging and accelerated aging tests.
AB - Result of aging test for 1.55μm MQW-DFB-DC-PBH-LDs, in terms of spectral linewidth, FM characteristics and lasing wavelength, is reported. Over 105 hours reliability was estimated from long term aging and accelerated aging tests.
UR - http://www.scopus.com/inward/record.url?scp=85067663616&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85067663616&partnerID=8YFLogxK
U2 - 10.1109/ISLC.1992.763662
DO - 10.1109/ISLC.1992.763662
M3 - Conference contribution
AN - SCOPUS:85067663616
T3 - Conference Digest - IEEE International Semiconductor Laser Conference
SP - 260
EP - 261
BT - Conference Digest - 13th IEEE International Semiconductor Laser Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th IEEE International Semiconductor Laser Conference, ISLC 1992
Y2 - 21 September 1992 through 25 September 1992
ER -