Reliability of high power MQW-DFB-DC-PBH-LDs for coherent optical communication system application

M. Kitamura, H. Yamazaki, H. Yamada, S. Takano, K. Kosuge, M. Yamaguchi, I. Mito

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Result of aging test for 1.55μm MQW-DFB-DC-PBH-LDs, in terms of spectral linewidth, FM characteristics and lasing wavelength, is reported. Over 105 hours reliability was estimated from long term aging and accelerated aging tests.

Original languageEnglish
Title of host publicationConference Digest - 13th IEEE International Semiconductor Laser Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages260-261
Number of pages2
ISBN (Electronic)4930813514
DOIs
Publication statusPublished - 1992 Jan 1
Externally publishedYes
Event13th IEEE International Semiconductor Laser Conference, ISLC 1992 - Takamatsu, Kagawa, Japan
Duration: 1992 Sep 211992 Sep 25

Publication series

NameConference Digest - IEEE International Semiconductor Laser Conference
Volume1992-September
ISSN (Print)0899-9406

Conference

Conference13th IEEE International Semiconductor Laser Conference, ISLC 1992
CountryJapan
CityTakamatsu, Kagawa
Period92/9/2192/9/25

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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