Reliability characteristics of W-La2O3 structures compared with those of HfO2-based gate oxides

J. Molina, F. J. De La Hidalga, P. Rosales, K. Kakushima, P. Ahmet, K. Tsutsui, N. Sugii, T. Hattori, H. Iwai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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