Relative sensitivity factors of aluminum, silicon and phosphorus against iron, and those of titanium, vanadium, chromium, iron and nickel against silicon for AES

Kichinosuke Hirokawa, Shigeru Suzuki, Hiroshi Kimura

Research output: Contribution to journalArticlepeer-review

Abstract

Relative Sensitivity Factors (RFs) for Fe, P, A1, Ti, V, Cr, Ni and Si Auger peaks are reported. Care must be taken when using RFs values for compounds owing to matrix effects.

Original languageEnglish
Pages (from-to)91-95
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume40
Issue number1
DOIs
Publication statusPublished - 1986

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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