Abstract
We have investigated the relationship between the magnetoresistance and the paracrystalline disorder of lattice plane spacings at the interface in Fe/Cr multilayer films prepared by rf sputtering. The X-ray linewidths for the (110) and (220) peaks were analysed using a modified paracrystalline theory to obtain the grain size and the lattice uncertainty, which represents the degree of paracrystalline disorder. We have found that the magnetoresistance increases with decreasing lattice uncertainty.
Original language | English |
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Pages (from-to) | 1169-1172 |
Number of pages | 4 |
Journal | journal of the physical society of japan |
Volume | 61 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1992 Sep |
Keywords
- Fe/Cr multilayer
- X-ray line broadening
- interface roughness
- magnetoresistance
- paracrystalline disorder
- rf sputtering
ASJC Scopus subject areas
- Physics and Astronomy(all)