Relationship between Magnetoresistance and Lattice Uncertainty at the Interface in Sputtered Fe/Cr Multilayer Films

Kôki Takanashi, Yoshihisa Obi, Yuichiro Mitani, Hiroyasu Fujimori

Research output: Contribution to journalArticlepeer-review

34 Citations (Scopus)

Abstract

We have investigated the relationship between the magnetoresistance and the paracrystalline disorder of lattice plane spacings at the interface in Fe/Cr multilayer films prepared by rf sputtering. The X-ray linewidths for the (110) and (220) peaks were analysed using a modified paracrystalline theory to obtain the grain size and the lattice uncertainty, which represents the degree of paracrystalline disorder. We have found that the magnetoresistance increases with decreasing lattice uncertainty.

Original languageEnglish
Pages (from-to)1169-1172
Number of pages4
Journaljournal of the physical society of japan
Volume61
Issue number4
DOIs
Publication statusPublished - 1992 Sep

Keywords

  • Fe/Cr multilayer
  • X-ray line broadening
  • interface roughness
  • magnetoresistance
  • paracrystalline disorder
  • rf sputtering

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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