Relationship between Magnetoresistance and Lattice Uncertainty at the Interface in Sputtered Fe/Cr Multilayer Films

Kôki Takanashi; Yoshihisa Obi; Yuichiro Mitani; Hiroyasu Fujimori

doi:10.1143/JPSJ.61.1169

Relationship between Magnetoresistance and Lattice Uncertainty at the Interface in Sputtered Fe/Cr Multilayer Films

Kôki Takanashi, Yoshihisa Obi, Yuichiro Mitani, Hiroyasu Fujimori

Collaborative Research Center on Energy Materials

Research output: Contribution to journal › Article › peer-review

34 Citations (Scopus)

Abstract

We have investigated the relationship between the magnetoresistance and the paracrystalline disorder of lattice plane spacings at the interface in Fe/Cr multilayer films prepared by rf sputtering. The X-ray linewidths for the (110) and (220) peaks were analysed using a modified paracrystalline theory to obtain the grain size and the lattice uncertainty, which represents the degree of paracrystalline disorder. We have found that the magnetoresistance increases with decreasing lattice uncertainty.

Original language	English
Pages (from-to)	1169-1172
Number of pages	4
Journal	journal of the physical society of japan
Volume	61
Issue number	4
DOIs	https://doi.org/10.1143/JPSJ.61.1169
Publication status	Published - 1992 Sep

Keywords

Fe/Cr multilayer
X-ray line broadening
interface roughness
magnetoresistance
paracrystalline disorder
rf sputtering

ASJC Scopus subject areas

Physics and Astronomy(all)

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abstract = "We have investigated the relationship between the magnetoresistance and the paracrystalline disorder of lattice plane spacings at the interface in Fe/Cr multilayer films prepared by rf sputtering. The X-ray linewidths for the (110) and (220) peaks were analysed using a modified paracrystalline theory to obtain the grain size and the lattice uncertainty, which represents the degree of paracrystalline disorder. We have found that the magnetoresistance increases with decreasing lattice uncertainty.",

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AU - Mitani, Yuichiro

AU - Fujimori, Hiroyasu

PY - 1992/9

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AB - We have investigated the relationship between the magnetoresistance and the paracrystalline disorder of lattice plane spacings at the interface in Fe/Cr multilayer films prepared by rf sputtering. The X-ray linewidths for the (110) and (220) peaks were analysed using a modified paracrystalline theory to obtain the grain size and the lattice uncertainty, which represents the degree of paracrystalline disorder. We have found that the magnetoresistance increases with decreasing lattice uncertainty.

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KW - interface roughness

KW - magnetoresistance

KW - paracrystalline disorder

KW - rf sputtering

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Relationship between Magnetoresistance and Lattice Uncertainty at the Interface in Sputtered Fe/Cr Multilayer Films

Abstract

Keywords

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