Abstract
We analyzed the dislocation distribution of cold-drawn pearlitic-steel wire by using the line-profile analysis based on the energy dispersive X-ray diffraction (EDXD). Although this line-profile analysis requires a high resolution in reciprocal space, the resolution for EDXD is generally poor due to the energy resolution of the detector. Our analysis demonstrated that the resolution in the reciprocal space can be maximized at small scattering angles. Using the line-profile analysis based on the EDXD, the microstructural parameters such as the crystallite size and the dislocation density of the ferrite phase in the pearlitic steel were successfully analyzed. In addition, the distribution of the residual stress of the ferrite phase of a pearlitic steel wire was also analyzed using the EDXD measurement.
Original language | English |
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Pages (from-to) | 152-160 |
Number of pages | 9 |
Journal | Materials Characterization |
Volume | 83 |
DOIs | |
Publication status | Published - 2013 |
Keywords
- Dislocation density
- Energy dispersive X-ray diffraction
- Line-profile analysis
- Pearlitic steel
- Residual stress
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering