The relation between the efficiency of scanning tunneling microscope light emission (STM-LE) and the radius of tip curvature has been studied using silver tips. The emission efficiency increases with decreasing radius of tip curvature ρ for ρ>80 nm. This result agrees qualitatively with the prediction of a theory that includes the effect of electromagnetic retardation.
|Number of pages||2|
|Journal||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|Publication status||Published - 2000 Aug 1|
ASJC Scopus subject areas
- Physics and Astronomy(all)