Relation between the radius of tip curvature and the light emission efficiency from scanning tunneling microscope

Masayuki Iwami, Yoichi Uehara, Sukekatu Ushioda

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

The relation between the efficiency of scanning tunneling microscope light emission (STM-LE) and the radius of tip curvature has been studied using silver tips. The emission efficiency increases with decreasing radius of tip curvature ρ for ρ>80 nm. This result agrees qualitatively with the prediction of a theory that includes the effect of electromagnetic retardation.

Original languageEnglish
Pages (from-to)4912-4913
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume39
Issue number8
Publication statusPublished - 2000 Aug 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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