Reinvestigation of the structure of si(111)√3×√3−Ag Surface

Shozo Kono, Tadashi Abukawa, Natsuo Nakamura, Koh Ichi Anno

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)

Abstract

Critical Ag coverage of the Si(111) √3 × √3-Ag surface has been examined by µ181;-probe Auger electron spectroscopy and found to be one monolayer, consistent with results of other conventional surface spectroscopies. Analyses of previously reported X-ray photoelectron diffraction patterns have indicated that symmetric 1-monolayer models, including a recent honeycomb chained triangle model (Jpn. J. Appl. Phys. 27 (1988) L753) and its derivatives, are unlikely. An asymmetric 1-monolayer model is presented from the analysis of X-ray photoelectron diffraction and is to be tested by other methods.

Original languageEnglish
Pages (from-to)L1278-L1281
JournalJapanese journal of applied physics
Volume28
Issue number7 A
DOIs
Publication statusPublished - 1989 Jul

Keywords

  • Ag overlayer
  • Auger electron spectroscopy
  • Metal/semiconductor interface
  • Photoelectron diffraction
  • Si(111)
  • Solid surface

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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