TY - JOUR
T1 - Reinvestigation of the structure of si(111)√3×√3−Ag Surface
AU - Kono, Shozo
AU - Abukawa, Tadashi
AU - Nakamura, Natsuo
AU - Anno, Koh Ichi
PY - 1989/7
Y1 - 1989/7
N2 - Critical Ag coverage of the Si(111) √3 × √3-Ag surface has been examined by µ181;-probe Auger electron spectroscopy and found to be one monolayer, consistent with results of other conventional surface spectroscopies. Analyses of previously reported X-ray photoelectron diffraction patterns have indicated that symmetric 1-monolayer models, including a recent honeycomb chained triangle model (Jpn. J. Appl. Phys. 27 (1988) L753) and its derivatives, are unlikely. An asymmetric 1-monolayer model is presented from the analysis of X-ray photoelectron diffraction and is to be tested by other methods.
AB - Critical Ag coverage of the Si(111) √3 × √3-Ag surface has been examined by µ181;-probe Auger electron spectroscopy and found to be one monolayer, consistent with results of other conventional surface spectroscopies. Analyses of previously reported X-ray photoelectron diffraction patterns have indicated that symmetric 1-monolayer models, including a recent honeycomb chained triangle model (Jpn. J. Appl. Phys. 27 (1988) L753) and its derivatives, are unlikely. An asymmetric 1-monolayer model is presented from the analysis of X-ray photoelectron diffraction and is to be tested by other methods.
KW - Ag overlayer
KW - Auger electron spectroscopy
KW - Metal/semiconductor interface
KW - Photoelectron diffraction
KW - Si(111)
KW - Solid surface
UR - http://www.scopus.com/inward/record.url?scp=0024705649&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0024705649&partnerID=8YFLogxK
U2 - 10.1143/JJAP.28.L1278
DO - 10.1143/JJAP.28.L1278
M3 - Article
AN - SCOPUS:0024705649
VL - 28
SP - L1278-L1281
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 7 A
ER -