TY - JOUR
T1 - Refracted X-rays propagating near the surface under grazing incidence condition
AU - Hayashi, Kouichi
AU - Kawai, Jun
AU - Moriyama, Yoshihiko
AU - Horiuchi, Toshihisa
AU - Matsushige, Kazumi
N1 - Funding Information:
This work was partly supported by a Grant-in-Aid for Exploratory Research from the Ministry of Education, Science, Sports and Culture, Japan, and by the KU-VBL (Kyoto University-Venture Business Laboratory) Project.
PY - 1999/1/4
Y1 - 1999/1/4
N2 - X-ray refractions through a silicon wafer and an organic thin film, n-C33H68/Si, were measured using white incident X-rays under a grazing incidence condition. The energy variation of a refracted X-ray beam by a silicon wafer was well explained by the simple Snell's law when the position of the detector (solid-state detector) was changed. On the other hand, two refracted X-ray beams were observed from the organic thin film. The energy variation of one beam which propagated through the silicon substrate followed Snell's law, while that of another beam did not and changed little when the detector position was varied.
AB - X-ray refractions through a silicon wafer and an organic thin film, n-C33H68/Si, were measured using white incident X-rays under a grazing incidence condition. The energy variation of a refracted X-ray beam by a silicon wafer was well explained by the simple Snell's law when the position of the detector (solid-state detector) was changed. On the other hand, two refracted X-ray beams were observed from the organic thin film. The energy variation of one beam which propagated through the silicon substrate followed Snell's law, while that of another beam did not and changed little when the detector position was varied.
UR - http://www.scopus.com/inward/record.url?scp=0033521423&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0033521423&partnerID=8YFLogxK
U2 - 10.1016/S0584-8547(98)00192-X
DO - 10.1016/S0584-8547(98)00192-X
M3 - Article
AN - SCOPUS:0033521423
VL - 54
SP - 227
EP - 230
JO - Spectrochimica Acta - Part B Atomic Spectroscopy
JF - Spectrochimica Acta - Part B Atomic Spectroscopy
SN - 0584-8547
IS - 1
ER -