@article{8aad9049b6cf4ee8bc6a265dc46f5f57,
title = "Reflection electron diffraction intensity oscillation during molecular beam epitaxial growth of (GaAs)n/(InAs)n superlattice semiconductor",
author = "H. Ohno and R. Katsumi and H. Hasegawa",
note = "Funding Information: We acknowledge Dr. T. Takama for helpful discussions on X-ray diffraction. This work is partially supported by a Grant-in-Aid from the Ministry of Education, Science and Culture of Japan. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.",
year = "1986",
month = aug,
day = "3",
doi = "10.1016/0039-6028(86)90478-4",
language = "English",
volume = "174",
pages = "598--599",
journal = "Surface Science",
issn = "0039-6028",
publisher = "Elsevier",
number = "1-3",
}