Refinement of X-ray fluorescence holography for determination of local atomic environment

Kouichi Hayashi, Yukio Takahashi, Ei Ichiro Matsubara

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

X-ray fluorescence holography (XFH) is a promising method for determination of a local environment around a particular element. Since the holographic signal is about 0.3% of the background isotropic fluorescent radiation, it takes a few months to record a set of complete XFH data using a conventional energy dispersive detector. In order to overcome this difficulty, we designed an XFH setup with a combination system of a cylindrical LiF analyzer and an avalanche photo diode (APD) for bulk samples, and with a multi-element SSD for impurity samples. The holography experiments of an Au single crystal and Zn atoms doped in a GaAs wafer performed with these systems at the synchrotron radiation facility SPring-8 enables us to obtain high quality hologram data within a practical measurement time.

Original languageEnglish
Pages (from-to)1464-1468
Number of pages5
JournalMaterials Transactions
Volume43
Issue number7
DOIs
Publication statusPublished - 2002 Jul

Keywords

  • Impurity
  • Single crystal
  • Structural analysis
  • X-ray fluorescence holography

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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