Refinement of X-ray fluorescence holography for determination of local atomic environment

X-ray fluorescence holography (XFH) is a promising method for determination of a local environment around a particular element. Since the holographic signal is about 0.3% of the background isotropic fluorescent radiation, it takes a few months to record a set of complete XFH data using a conventional energy dispersive detector. In order to overcome this difficulty, we designed an XFH setup with a combination system of a cylindrical LiF analyzer and an avalanche photo diode (APD) for bulk samples, and with a multi-element SSD for impurity samples. The holography experiments of an Au single crystal and Zn atoms doped in a GaAs wafer performed with these systems at the synchrotron radiation facility SPring-8 enables us to obtain high quality hologram data within a practical measurement time.