Reduction of anisotropic image resolution in transmission electron microtomography by use of quadrangular prism-shaped section

Takeshi Kaneko, Hideo Nishioka, Toshio Nishi, Hiroshi Jinnai

Research output: Contribution to journalArticlepeer-review

34 Citations (Scopus)

Abstract

A quadrangular prism specimen (a 'prism-shaped' section) was observed in three-dimension (3-D) by transmission electron microtomography (TEMT) over as wide a tilt range as possible. Two types of specimens were prepared for the TEMT experiments: (i) a prism-shaped section of a block copolymer nanostructure, whose cross section was 200 nm on each side and (ii) a conventional ultrathin section having the same thickness (∼200 nm) as the prism-shaped section. Image quality of the projections taken at high tilt angles, e.g. 60°, of the prism-shaped section was considerably better than that of the ultrathin section. This was because the path length of electron beam of the prism-shaped section was shorter (and hence the transmission was higher) than that of the ultrathin section at the same tilt angle. Thus, although the projections of the ultrathin section at the tilt angle larger than ∼40° did not effectively contribute to the 3-D reconstruction, those of the prism-shaped section at very high tilt angles, e.g. ±75°, can still be used for the 3-D reconstruction. Three orthogonal cross-sectional views of the 3-D reconstruction were extensively compared between the two sections. It was found that (i) the image contrast of the 3-D reconstruction was significantly enhanced and (ii) an elongation of structural object due to limitation of the angular range in the electron tomography was considerably reduced using the prism-shaped section.

Original languageEnglish
Pages (from-to)437-444
Number of pages8
JournalJournal of Electron Microscopy
Volume54
Issue number5
DOIs
Publication statusPublished - 2005 Oct 1
Externally publishedYes

Keywords

  • Block copolymer
  • Electron tomography
  • Image resolution
  • Three-dimensional reconstruction

ASJC Scopus subject areas

  • Instrumentation

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