Recovery dynamics of a saturable absorber in modelocked laser diodes

Ichiro Ogura, Yoichi Hashimoto, Hisakazu Kurita, Takanori Shimizu, Hiroyuki Yokoyama

Research output: Contribution to journalConference articlepeer-review


An optical intensity correlation measurement is carried out on the recovery of saturable absorber (SA) in an modelocked semiconductor laser diode (MLLD) device in picosecond temporal regions. Optical pulse train of few picosecond with repetition rates of up to 10 GHz is used to provide direct information on the SA response to high-repetition optical pulses as occurs in actual modelocking operation. The shortest recovery time observed was 8 ps at a reverse bias of 2 V. Short recovery times at a large reverse bias are consistently observed over a wide range of pulse repetition rates and optical pump energies. The results showed that the fast SA recovery in the picosecond range takes place in actual modelocking operation.

Original languageEnglish
Number of pages1
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Publication statusPublished - 1997 Jan 1
Externally publishedYes
EventProceedings of the 1997 Conference on Lasers and Electro-Optics, CLEO - Baltimore, MD, USA
Duration: 1997 May 181997 May 23

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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