TY - GEN
T1 - Reconstruction of non-vanished conductivity crack from ECT signals based on shifting aperture method
AU - Yusa, N.
AU - Miya, K.
PY - 2000/1/1
Y1 - 2000/1/1
N2 - The numerical schemes based on neural networks with a shifting aperture method to reconstruct a crack shape from eddy current test (ECT) signals are presented. Aiming at the final goal of ECT study and the reconstruction of the cracks that occur in the actual steam generator tubes of pressurized water reactor power plants, the cracks considered are not electrodischarge machined notches but the natural ones with distributed conductivity. The data are obtained from numerical simulations using an FEM-BEM coupling method based on the A-φ formulation. A database approach, a kind of fast forward solver, is also applied to save computational resources. The results obtained show that the inverse scheme proposed in this paper can give quite an accurate reconstruction and is robust against noises.
AB - The numerical schemes based on neural networks with a shifting aperture method to reconstruct a crack shape from eddy current test (ECT) signals are presented. Aiming at the final goal of ECT study and the reconstruction of the cracks that occur in the actual steam generator tubes of pressurized water reactor power plants, the cracks considered are not electrodischarge machined notches but the natural ones with distributed conductivity. The data are obtained from numerical simulations using an FEM-BEM coupling method based on the A-φ formulation. A database approach, a kind of fast forward solver, is also applied to save computational resources. The results obtained show that the inverse scheme proposed in this paper can give quite an accurate reconstruction and is robust against noises.
KW - Eddy current testing
KW - crack reconstruction
KW - neural network
KW - shifting aperture method
UR - http://www.scopus.com/inward/record.url?scp=84969145267&partnerID=8YFLogxK
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U2 - 10.1109/IECON.2000.973232
DO - 10.1109/IECON.2000.973232
M3 - Conference contribution
AN - SCOPUS:84969145267
T3 - IECON Proceedings (Industrial Electronics Conference)
SP - 690
EP - 694
BT - IECON Proceedings (Industrial Electronics Conference)
PB - IEEE Computer Society
ER -