Abstract
This paper proposes an algorithm for multiple cracks reconstruction from ECT signals by means of a simulated annealing parallelized on a supercomputer. The algorithm takes not only the profiles of cracks but also the number of cracks as unknown, which is a very important feature from the practical point of view. A fast forward code using a database is upgraded for the rapid computation of the ECT signals of a differential mutual induction probe due to multiple cracks. The algorithm is applied to the reconstruction of the multiple cracks of a JSAEM round-robin test geometry. The reconstruction result using a simulated signal proves the validity of the proposed approach.
Original language | English |
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Pages (from-to) | 399-404 |
Number of pages | 6 |
Journal | International Journal of Applied Electromagnetics and Mechanics |
Volume | 19 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - 2004 |
Keywords
- Eddy current testing
- Multiple cracks
- Parallel computing
- Reconstruction
- Simulated annealing
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering