Reconstruction method for grating-based X-ray phase tomographic microscope

Ryosuke Ueda, Koh Hashimoto, Hidekazu Takano, Mingjian Cai, Atsushi Momose

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


Phase imaging has a higher sensitivity for low-Z materials than the conventional absorption imaging. We have developed a high-resolution X-ray phase microscope in combination with a Lau interferometer and used it for phase tomography. However, the existing method cannot avoid artifacts originating from the assumption of a two-beam interference model. In this study, we use a three-wave interference model to reduce the artifacts and propose a new method to attain phase tomography. In the presentation, we will demonstrate the reduction of the artifacts with the results of phase tomography.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography XIII
EditorsBert Muller, Ge Wang
ISBN (Electronic)9781510645189
Publication statusPublished - 2021
EventDevelopments in X-Ray Tomography XIII 2021 - San Diego, United States
Duration: 2021 Aug 12021 Aug 5

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceDevelopments in X-Ray Tomography XIII 2021
Country/TerritoryUnited States
CitySan Diego


  • Computed tomography
  • Lau interferometer
  • Microscopy
  • Phase imaging
  • Talbot effect

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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