Reciprocal-lattice space imaging of X-ray intensities diffracted from nanowires

Osami Sakata; Akiko Kitano; Wataru Yashiro; Kunihiro Sakamoto; Kazushi Miki; Akifumi Matsuda; Wakana Hara; Shusaku Akiba; Mamoru Yoshimoto

Reciprocal-lattice space imaging of X-ray intensities diffracted from nanowires

Osami Sakata, Akiko Kitano, Wataru Yashiro, Kunihiro Sakamoto, Kazushi Miki, Akifumi Matsuda, Wakana Hara, Shusaku Akiba, Mamoru Yoshimoto

Research output: Contribution to journal › Conference article › peer-review

7 Citations (Scopus)

Abstract

A nondestructive method has been developed for quickly characterizing a 1 D crystalline structure. It required brilliant synchrotron x-rays in grazing incidence and an x-ray 2 D detector. X-ray patterns recorded on the detector showed anisotropically sheet-shape diffraction from NiO nanowires epitaxially grown on an ultra-smooth sapphire (0 0 0 1). Other shots obtained from Bi atomic wires embedded in Si (0 0 1) showed that the wires have a 2 × n superstructure, which indicated that the Bi-dimer bonds were parallel to the wires.

Original language	English
Article number	Q6.4
Pages (from-to)	131-136
Number of pages	6
Journal	Materials Research Society Symposium Proceedings
Volume	840
Publication status	Published - 2005 Jun 20
Externally published	Yes
Event	Neutron and X-Ray Scattering as Probes of Multiscale Phenomena - Boston, MA, United States Duration: 2004 Nov 29 → 2004 Dec 1

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Cite this

Reciprocal-lattice space imaging of X-ray intensities diffracted from nanowires. / Sakata, Osami; Kitano, Akiko; Yashiro, Wataru; Sakamoto, Kunihiro; Miki, Kazushi; Matsuda, Akifumi; Hara, Wakana; Akiba, Shusaku; Yoshimoto, Mamoru.

In: Materials Research Society Symposium Proceedings, Vol. 840, Q6.4, 20.06.2005, p. 131-136.

Research output: Contribution to journal › Conference article › peer-review

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abstract = "A nondestructive method has been developed for quickly characterizing a 1 D crystalline structure. It required brilliant synchrotron x-rays in grazing incidence and an x-ray 2 D detector. X-ray patterns recorded on the detector showed anisotropically sheet-shape diffraction from NiO nanowires epitaxially grown on an ultra-smooth sapphire (0 0 0 1). Other shots obtained from Bi atomic wires embedded in Si (0 0 1) showed that the wires have a 2 × n superstructure, which indicated that the Bi-dimer bonds were parallel to the wires.",

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AU - Sakata, Osami

AU - Kitano, Akiko

AU - Yashiro, Wataru

AU - Sakamoto, Kunihiro

AU - Miki, Kazushi

AU - Matsuda, Akifumi

AU - Hara, Wakana

AU - Akiba, Shusaku

AU - Yoshimoto, Mamoru

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AB - A nondestructive method has been developed for quickly characterizing a 1 D crystalline structure. It required brilliant synchrotron x-rays in grazing incidence and an x-ray 2 D detector. X-ray patterns recorded on the detector showed anisotropically sheet-shape diffraction from NiO nanowires epitaxially grown on an ultra-smooth sapphire (0 0 0 1). Other shots obtained from Bi atomic wires embedded in Si (0 0 1) showed that the wires have a 2 × n superstructure, which indicated that the Bi-dimer bonds were parallel to the wires.

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Reciprocal-lattice space imaging of X-ray intensities diffracted from nanowires

Abstract

ASJC Scopus subject areas

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