Abstract
A nondestructive method has been developed for quickly characterizing a 1 D crystalline structure. It required brilliant synchrotron x-rays in grazing incidence and an x-ray 2 D detector. X-ray patterns recorded on the detector showed anisotropically sheet-shape diffraction from NiO nanowires epitaxially grown on an ultra-smooth sapphire (0 0 0 1). Other shots obtained from Bi atomic wires embedded in Si (0 0 1) showed that the wires have a 2 × n superstructure, which indicated that the Bi-dimer bonds were parallel to the wires.
| Original language | English |
|---|---|
| Article number | Q6.4 |
| Pages (from-to) | 131-136 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium Proceedings |
| Volume | 840 |
| Publication status | Published - 2005 Jun 20 |
| Externally published | Yes |
| Event | Neutron and X-Ray Scattering as Probes of Multiscale Phenomena - Boston, MA, United States Duration: 2004 Nov 29 → 2004 Dec 1 |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
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Sakata, O., Kitano, A., Yashiro, W., Sakamoto, K., Miki, K., Matsuda, A., Hara, W., Akiba, S., & Yoshimoto, M. (2005). Reciprocal-lattice space imaging of X-ray intensities diffracted from nanowires. Materials Research Society Symposium Proceedings, 840, 131-136. [Q6.4].