Reciprocal-lattice space imaging of X-ray intensities diffracted from nanowires

Osami Sakata, Akiko Kitano, Wataru Yashiro, Kunihiro Sakamoto, Kazushi Miki, Akifumi Matsuda, Wakana Hara, Shusaku Akiba, Mamoru Yoshimoto

Research output: Contribution to journalConference article

6 Citations (Scopus)

Abstract

A nondestructive method has been developed for quickly characterizing a 1 D crystalline structure. It required brilliant synchrotron x-rays in grazing incidence and an x-ray 2 D detector. X-ray patterns recorded on the detector showed anisotropically sheet-shape diffraction from NiO nanowires epitaxially grown on an ultra-smooth sapphire (0 0 0 1). Other shots obtained from Bi atomic wires embedded in Si (0 0 1) showed that the wires have a 2 × n superstructure, which indicated that the Bi-dimer bonds were parallel to the wires.

Original languageEnglish
Article numberQ6.4
Pages (from-to)131-136
Number of pages6
JournalMaterials Research Society Symposium Proceedings
Volume840
Publication statusPublished - 2005 Jun 20
Externally publishedYes
EventNeutron and X-Ray Scattering as Probes of Multiscale Phenomena - Boston, MA, United States
Duration: 2004 Nov 292004 Dec 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Sakata, O., Kitano, A., Yashiro, W., Sakamoto, K., Miki, K., Matsuda, A., Hara, W., Akiba, S., & Yoshimoto, M. (2005). Reciprocal-lattice space imaging of X-ray intensities diffracted from nanowires. Materials Research Society Symposium Proceedings, 840, 131-136. [Q6.4].