Recent progress in materials analysis by transmission electron microscopy

Daisuke Shindo

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Recent progress of materials analysis by transmission electron microscopy was reviewed. As one of the revolutions of peripheral instruments for electron microscopy, the emergence of new recording systems such as the imaging plate system was pointed out. By combining the new recording system with computer network system, quantitative analysis of high-resolution electron microscope images and electron diffraction patterns could be carried out. In analytical electron microscopy, a new technique called ALCHEMI could be applied successfully to locating additives in various intermetallic compounds. Experimental results obtained with an omega-type energy filter were presented.

Original languageEnglish
Pages (from-to)473-482
Number of pages10
JournalMaterials Transactions, JIM
Volume36
Issue number4
DOIs
Publication statusPublished - 1995 Jan 1

ASJC Scopus subject areas

  • Engineering(all)

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