Recent observations with phase-contrast X-ray computed tomography

Atsushi Momose, Tohoru Takeda, Yuji Itai, Jinhong Tu, Keiichi Hirano

Research output: Contribution to journalConference article

9 Citations (Scopus)

Abstract

Recent development in phase-contrast X-ray computed tomography using an X-ray interferometer is reported. To observe larger samples than is possible with our previous X-ray interferometer, a large monolithic X-ray interferometer and a separated-type X-ray interferometer were studied. At the present time, 2.5 cm×1.5 cm interference patterns have been generated with the X-ray interferometers using synchrotron X-rays. The large monolithic X-ray interferometer has produced interference fringes with 80% visibility, and has been used to measure various tissues. To produce images with higher spatial resolution, we fabricated another X-ray interferometer whose wafer was partially thinned by chemical etching. A preliminary test suggested that the spatial resolution has been improved.

Original languageEnglish
Pages (from-to)188-195
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3772
Publication statusPublished - 1999 Jan 1
Externally publishedYes
EventProceedings of the 1999 Developments in X-Ray Tomography II - Denver, CO, USA
Duration: 1999 Jul 221999 Jul 23

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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