Recent advances in X-ray fluorescence holography

Kouichi Hayashi

doi:10.1380/ejssnt.2011.363

Recent advances in X-ray fluorescence holography

Kouichi Hayashi

Materials Development Division

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

X-ray uorescence holography (XFH) provides three dimensional atomic images around specied elements. The XFH uses atoms as a wave source or monitor of interference eld within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence.

Original language	English
Pages (from-to)	363-370
Number of pages	8
Journal	e-Journal of Surface Science and Nanotechnology
Volume	9
DOIs	https://doi.org/10.1380/ejssnt.2011.363
Publication status	Published - 2011 Oct 1

Keywords

Impurity
Single crystal
X-ray holography
X-ray scattering
X-ray uorescence holography

ASJC Scopus subject areas

Biotechnology
Bioengineering
Condensed Matter Physics
Mechanics of Materials
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1380/ejssnt.2011.363

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@article{6a68b683d88f496994f722e77a7ce5da,

title = "Recent advances in X-ray fluorescence holography",

abstract = "X-ray uorescence holography (XFH) provides three dimensional atomic images around specied elements. The XFH uses atoms as a wave source or monitor of interference eld within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence.",

keywords = "Impurity, Single crystal, X-ray holography, X-ray scattering, X-ray uorescence holography",

author = "Kouichi Hayashi",

year = "2011",

month = oct,

day = "1",

doi = "10.1380/ejssnt.2011.363",

language = "English",

volume = "9",

pages = "363--370",

journal = "e-Journal of Surface Science and Nanotechnology",

issn = "1348-0391",

publisher = "Surface Science Society of Japan",

}

TY - JOUR

T1 - Recent advances in X-ray fluorescence holography

AU - Hayashi, Kouichi

PY - 2011/10/1

Y1 - 2011/10/1

N2 - X-ray uorescence holography (XFH) provides three dimensional atomic images around specied elements. The XFH uses atoms as a wave source or monitor of interference eld within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence.

AB - X-ray uorescence holography (XFH) provides three dimensional atomic images around specied elements. The XFH uses atoms as a wave source or monitor of interference eld within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence.

KW - Impurity

KW - Single crystal

KW - X-ray holography

KW - X-ray scattering

KW - X-ray uorescence holography

UR - http://www.scopus.com/inward/record.url?scp=80054012150&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80054012150&partnerID=8YFLogxK

U2 - 10.1380/ejssnt.2011.363

DO - 10.1380/ejssnt.2011.363

M3 - Article

AN - SCOPUS:80054012150

VL - 9

SP - 363

EP - 370

JO - e-Journal of Surface Science and Nanotechnology

JF - e-Journal of Surface Science and Nanotechnology

SN - 1348-0391

ER -