Abstract
X-ray uorescence holography (XFH) provides three dimensional atomic images around specied elements. The XFH uses atoms as a wave source or monitor of interference eld within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence.
| Original language | English |
|---|---|
| Pages (from-to) | 363-370 |
| Number of pages | 8 |
| Journal | e-Journal of Surface Science and Nanotechnology |
| Volume | 9 |
| DOIs | |
| Publication status | Published - 2011 Oct 1 |
Keywords
- Impurity
- Single crystal
- X-ray holography
- X-ray scattering
- X-ray uorescence holography
ASJC Scopus subject areas
- Biotechnology
- Bioengineering
- Condensed Matter Physics
- Mechanics of Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films