Recent advances in X-ray fluorescence holography

Kouichi Hayashi

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


X-ray uorescence holography (XFH) provides three dimensional atomic images around specied elements. The XFH uses atoms as a wave source or monitor of interference eld within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence.

Original languageEnglish
Pages (from-to)363-370
Number of pages8
Journale-Journal of Surface Science and Nanotechnology
Publication statusPublished - 2011 Oct 1


  • Impurity
  • Single crystal
  • X-ray holography
  • X-ray scattering
  • X-ray uorescence holography

ASJC Scopus subject areas

  • Biotechnology
  • Bioengineering
  • Condensed Matter Physics
  • Mechanics of Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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