Real-space observation of quasicrystalline Sn monolayer formed on the fivefold surface of icosahedral AlCuFe quasicrystal

H. R. Sharma, M. Shimoda, A. R. Ross, T. A. Lograsso, A. P. Tsai

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34 Citations (Scopus)

Abstract

We investigate a thin Sn film grown at elevated temperatures on the fivefold surface of an icosahedral AlCuFe quasicrystal by scanning tunneling microscopy (STM). At about one monolayer coverage, the deposited Sn is found to form a smooth film of height consistent with one-half of the lattice constant of the bulk Sn. Analysis based on the Fourier transform and autocorrelation function derived from high-resolution STM images reveals that Sn grows pseudomorphically and hence exhibits a quasicrystalline structure.

Original languageEnglish
Article number045428
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume72
Issue number4
DOIs
Publication statusPublished - 2005 Jul 15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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