TY - JOUR
T1 - Real-space analysis of scanning tunneling microscopy topography datasets using sparse modeling approach
AU - Miyama, Masamichi J.
AU - Hukushima, Koji
N1 - Funding Information:
Acknowledgements We are grateful to Y. Okada and T. Hitosugi for providing STM data and for useful discussions. We also thank M. Okada, Y. Kabashima, M. Ohzeki, T. Obuchi, and Y. Nakanishi-Ohno for useful discussions. This work was supported by JSPS KAKENHI Grant Numbers JP25120010, JP25610102, and JP15K13529. This work was also supported by the “Materials Research by Information Integration” Initiative (MI2I) Project of the Support Program for Starting Up Innovation Hub from Japan Science and Technology Agency (JST).
Publisher Copyright:
© 2018 The Physical Society of Japan.
PY - 2018
Y1 - 2018
N2 - A sparse modeling approach is proposed for analyzing scanning tunneling microscopy topography data, which contain numerous peaks originating from the electron density of surface atoms and=or impurities. The method, based on the relevance vector machine with L1 regularization and k-means clustering, enables separation of the peaks and peak center positioning with accuracy beyond the resolution of the measurement grid. The validity and efficiency of the proposed method are demonstrated using synthetic data in comparison with the conventional least-squares method. An application of the proposed method to experimental data of a metallic oxide thin-film clearly indicates the existence of defects and corresponding local lattice distortions.
AB - A sparse modeling approach is proposed for analyzing scanning tunneling microscopy topography data, which contain numerous peaks originating from the electron density of surface atoms and=or impurities. The method, based on the relevance vector machine with L1 regularization and k-means clustering, enables separation of the peaks and peak center positioning with accuracy beyond the resolution of the measurement grid. The validity and efficiency of the proposed method are demonstrated using synthetic data in comparison with the conventional least-squares method. An application of the proposed method to experimental data of a metallic oxide thin-film clearly indicates the existence of defects and corresponding local lattice distortions.
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U2 - 10.7566/JPSJ.87.044801
DO - 10.7566/JPSJ.87.044801
M3 - Article
AN - SCOPUS:85043709777
VL - 87
JO - Journal of the Physical Society of Japan
JF - Journal of the Physical Society of Japan
SN - 0031-9015
IS - 4
M1 - 044801
ER -