Real information recording in ferroelectric data storage medium with memory density of 1 Tbit/inch2

K. Tanaka, Y. Hiranaga, Y. Cho

Research output: Chapter in Book/Report/Conference proceedingConference contribution


In this study, a new method to achieve real information recording with a density of 1 Tbit/inch2 in ferroelectric data storage systems is proposed. In this system, data bits were written in the form of the polarization direction of nano domains, Local domain switching was carried out by applying a voltage pulse. A series of test writes revealed that the bit size varied according to the polarization direction of the bits in the immediate environment. Therefore, in order to keep the bit size constant (at 25.6 nm), the pulse amplitude required to create each individual bit was calculated as a function of the polarities of the surrounding data bits. As a result, real information storage at a density of 1 Tbit/inch2 was successfully achieved, with a low bit error rate of 1.8 × 10-2.

Original languageEnglish
Title of host publicationFerroelectric Thin Films XIII
Number of pages6
Publication statusPublished - 2005 Dec 1
Event2005 MRS Fall Meeting - Boston, MA, United States
Duration: 2005 Nov 282005 Dec 2

Publication series

NameMaterials Research Society Symposium Proceedings
ISSN (Print)0272-9172


Other2005 MRS Fall Meeting
CountryUnited States
CityBoston, MA

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Real information recording in ferroelectric data storage medium with memory density of 1 Tbit/inch<sup>2</sup>'. Together they form a unique fingerprint.

Cite this