Readout QDC for CdTe x-ray imager using direct charge treatment

Katsuyuki Takagi, Toshiyuki Takagi, Tsuyoshi Terao, Akifumi Koike, Toru Aoki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

X-ray imaging is popular in medical imaging, non-destructive testing and security. Main techniques of X-ray imaging with semiconductor detectors are charge accumulation and photon counting, and the photon counting is expected to identify materials at the same time with taking X-ray photograph by using energy information of X-ray photons. We proposed a direct charge handling method to build a photon counting system with energy information for X-ray imaging. This method operates the charge from the X-ray detector and converts it to encoded digital bit pattern directly without dead time of the front-end circuit. We simulated and built a proposed system to prove operating principals.

Original languageEnglish
Title of host publicationImage Sensing Technologies
Subtitle of host publicationMaterials, Devices, Systems, and Applications V
EditorsAchyut K. Dutta, Nibir K. Dhar
PublisherSPIE
ISBN (Electronic)9781510618237
DOIs
Publication statusPublished - 2018
EventImage Sensing Technologies: Materials, Devices, Systems, and Applications V 2018 - Orlando, United States
Duration: 2018 Apr 162018 Apr 19

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10656
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherImage Sensing Technologies: Materials, Devices, Systems, and Applications V 2018
CountryUnited States
CityOrlando
Period18/4/1618/4/19

Keywords

  • CDTE
  • Direct Charge Treatment
  • QDC
  • Readout
  • X-Ray Imager

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Takagi, K., Takagi, T., Terao, T., Koike, A., & Aoki, T. (2018). Readout QDC for CdTe x-ray imager using direct charge treatment. In A. K. Dutta, & N. K. Dhar (Eds.), Image Sensing Technologies: Materials, Devices, Systems, and Applications V [106561W] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10656). SPIE. https://doi.org/10.1117/12.2316419