RBS and SEM analysis of the nickel-fullerene hybrid systems

Jiri Vacik, Hiroshi Naramoto, Kazumasa Narumi, Shunya Yamamoto, Hiroaki Abe

Research output: Contribution to journalConference articlepeer-review

9 Citations (Scopus)


Surprising structural variability of the Ni/C60/Ni thin film packaging was observed after annealing at elevated temperatures. The thermal processing of the Ni/C60/Ni multilayer led to a gradual disruption of the C60 layer and to the formation of micron-sized octagonal 'pits' and rod-type particles. The unusual thermal response points out the complex physiochemical processes incited in the hybrid system by heat treatment. Here, based on the SEM and RBS analysis, the first insight into the microstructural evolution of the Ni/C60/Ni multilayer is presented.

Original languageEnglish
Pages (from-to)395-398
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Publication statusPublished - 2003 May
Event13th International conference on Ion beam modification of Mate - Kobe, Japan
Duration: 2002 Sept 12002 Sept 6


  • Fullerene
  • Multilayer
  • Nickel
  • RBS
  • SEM
  • Thermal annealing

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation


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