@inproceedings{ed5f14c4bae147189abb55e858318b62,
title = "Ray-tracing analysis of fresnel-zone-plate optical system as an electron beam profile monitor",
abstract = "The analysis of the image distortion made by Fresnel-zone-plate optical system was studied with ray trace simulation and analytical treatment. The tolerable tilt angle depends on the tolerable image size. The distortion appears not only in image size but in image inclination. The simulation and the analysis performed for the optical parameters of the electron beam profile monitor may be useful for the advancement of the X-ray microscope performance.",
keywords = "Electron beam profile monitor, Fresnel zone plate, Optical path function, Ray trace",
author = "Masami Fujisawa and Hiroshi Sakai and Norio Nakamura and Hitoshi Hayano and Toshiya Muto",
year = "2007",
month = mar,
day = "26",
doi = "10.1063/1.2436259",
language = "English",
isbn = "0735403732",
series = "AIP Conference Proceedings",
pages = "1117--1120",
booktitle = "SYNCHROTRON RADIATION INSTRUMENTATION",
note = "SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation ; Conference date: 28-05-2006 Through 28-06-2006",
}