Ray-tracing analysis of fresnel-zone-plate optical system as an electron beam profile monitor

Masami Fujisawa, Hiroshi Sakai, Norio Nakamura, Hitoshi Hayano, Toshiya Muto

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

The analysis of the image distortion made by Fresnel-zone-plate optical system was studied with ray trace simulation and analytical treatment. The tolerable tilt angle depends on the tolerable image size. The distortion appears not only in image size but in image inclination. The simulation and the analysis performed for the optical parameters of the electron beam profile monitor may be useful for the advancement of the X-ray microscope performance.

Original languageEnglish
Title of host publicationSYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publicationNinth International Conference on Synchrotron Radiation Instrumentation
Pages1117-1120
Number of pages4
DOIs
Publication statusPublished - 2007 Mar 26
Externally publishedYes
EventSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
Duration: 2006 May 28 → 2006 Jun 28

Publication series

NameAIP Conference Proceedings
Volume879
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
CountryKorea, Republic of
CityDaegu
Period06/5/28 → 06/6/28

Keywords

  • Electron beam profile monitor
  • Fresnel zone plate
  • Optical path function
  • Ray trace

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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