Random telegraph noise measurement and analysis based on arrayed test circuit toward high S/N CMOS image sensors

Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Fingerprint Dive into the research topics of 'Random telegraph noise measurement and analysis based on arrayed test circuit toward high S/N CMOS image sensors'. Together they form a unique fingerprint.

Engineering & Materials Science