Random imperfection (I)

Kiyohiro Ikeda, Kazuo Murota

Research output: Chapter in Book/Report/Conference proceedingChapter


The critical load of a structure is subject to a probabilistic scatter when it is modeled as a function of several random imperfections. This chapter offers a procedure to obtain the probability density function of the critical load for structures with a number of imperfections with known probabilistic characteristics. Chapter 3, “Imperfection Sensitivity Laws,” is a foundation of this chapter, and this chapter is extended to a system with group symmetry in Chap. 11.

Original languageEnglish
Title of host publicationApplied Mathematical Sciences (Switzerland)
Number of pages20
Publication statusPublished - 2019 Jan 1

Publication series

NameApplied Mathematical Sciences (Switzerland)
ISSN (Print)0066-5452
ISSN (Electronic)2196-968X


  • Critical point
  • Distribution of minimum values
  • Imperfection
  • Imperfection sensitivity
  • Limit point
  • Pitchfork bifurcation
  • Probability density function
  • Random imperfection
  • Transcritical bifurcation

ASJC Scopus subject areas

  • Applied Mathematics


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