TY - CHAP

T1 - Random imperfection (I)

AU - Ikeda, Kiyohiro

AU - Murota, Kazuo

PY - 2019/1/1

Y1 - 2019/1/1

N2 - The critical load of a structure is subject to a probabilistic scatter when it is modeled as a function of several random imperfections. This chapter offers a procedure to obtain the probability density function of the critical load for structures with a number of imperfections with known probabilistic characteristics. Chapter 3, “Imperfection Sensitivity Laws,” is a foundation of this chapter, and this chapter is extended to a system with group symmetry in Chap. 11.

AB - The critical load of a structure is subject to a probabilistic scatter when it is modeled as a function of several random imperfections. This chapter offers a procedure to obtain the probability density function of the critical load for structures with a number of imperfections with known probabilistic characteristics. Chapter 3, “Imperfection Sensitivity Laws,” is a foundation of this chapter, and this chapter is extended to a system with group symmetry in Chap. 11.

KW - Critical point

KW - Distribution of minimum values

KW - Imperfection

KW - Imperfection sensitivity

KW - Limit point

KW - Pitchfork bifurcation

KW - Probability density function

KW - Random imperfection

KW - Transcritical bifurcation

UR - http://www.scopus.com/inward/record.url?scp=85073156646&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85073156646&partnerID=8YFLogxK

U2 - 10.1007/978-3-030-21473-9_5

DO - 10.1007/978-3-030-21473-9_5

M3 - Chapter

AN - SCOPUS:85073156646

T3 - Applied Mathematical Sciences (Switzerland)

SP - 121

EP - 140

BT - Applied Mathematical Sciences (Switzerland)

PB - Springer

ER -