Raman spectroscopy: Characterization of edges, defects, and the Fermi energy of graphene and sp 2 Carbons

M. S. Dresselhaus, A. Jorio, L. G. Cançado, G. Dresselhaus, Riichiro Saito

Research output: Chapter in Book/Report/Conference proceedingChapter

13 Citations (Scopus)

Abstract

From the basic physical concepts relating to the Raman spectra of graphene, we can develop characterization methods for point defects and the edge structure. Furthermore, the Fermi energy can be studied by the phonon softening phenomena of the Raman spectra. Finally, we also discuss recent progress on nearfield optics.

Original languageEnglish
Title of host publicationGraphene Nanoelectronics
Subtitle of host publicationMetrology, Synthesis,Properties and Applications
EditorsHassan Raza
Pages15-55
Number of pages41
DOIs
Publication statusPublished - 2012 Oct 8

Publication series

NameNanoScience and Technology
Volume57
ISSN (Print)1434-4904

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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