The Fine Pixel CCD (FPCCD) is one of the candidate sensor tech-nologies for the ILC vertex detector. The vertex detector is located near the interaction point, thus high radiation tolerance is required. Charge transfer efficiency of CCD is degraded by radiation damage which makes traps in pixels. We measured charge transfer inefficiency (CTI) of a neu-tron irradiated FPCCD prototype. We observed a degradation of CTI compared with non-irradiated CCD. To improve the CTI of irradiated CCD, we performed the fat-zero charge injection to fill the traps. In this paper, we report a status of CTI improvement.
|Publication status||Published - 2016|
|Event||2016 International Workshop on Future Linear Colliders, LCWS 2016 - Morioka, Japan|
Duration: 2016 Dec 5 → 2016 Dec 9
|Other||2016 International Workshop on Future Linear Colliders, LCWS 2016|
|Period||16/12/5 → 16/12/9|
ASJC Scopus subject areas
- Nuclear and High Energy Physics