Radiation damage to tetramethylsilane and tetramethylgermanium ionization chambers

K. Oyama, H. Akaishi, M. Higuchi, Y. Hoshi, H. Yuta, K. Abe, K. Hasegawa, F. Suekane, T. Nagamine, N. Kawamura, K. Neichi, J. Katayama, T. Nakajima, K. Masuda, R. Kikuchi, K. Miyano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Two detector media suitable for a warm liquid, ionization chamber filled with tetramethylsilane(TMS) and tetramethylgermanium(TMG) were exposed to γ radiation of 60Co source up to dose 579Gray and 902Gray, respectively. The electron lifetimes and the free ion yields were measured as function of accumulated radiation dose. A similar behaviours of the electron lifetime and the free ion yields with increasing radiation dose were observed between the TMS and TMG ionization chambers.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium & Medical Imaging Conference
PublisherPubl by IEEE
Pages135-137
Number of pages3
Editionpt 1
ISBN (Print)0780314883
Publication statusPublished - 1994
EventProceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference - San Francisco, CA, USA
Duration: 1993 Oct 301993 Nov 6

Publication series

NameIEEE Nuclear Science Symposium & Medical Imaging Conference
Numberpt 1

Other

OtherProceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference
CitySan Francisco, CA, USA
Period93/10/3093/11/6

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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