Radiation Damage to Tetramethlysilane and Tetramethlygermanium Ionization Chambers

Y. Hoshi, M. Higuchi, K. Oyama, H. Akaishi, H. Yuta, K. Abe, K. Hasegawa, F. Suekane, T. Ngamine, N. Kawamura, K. Neichi, J. Katayama, T. Nakajima, K. Masuda, R. Kikuchi, K. Miyano

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Two detector media suitable for a warm liquid, ionization chamber filled with tetramethylsilane(TMS) and tetrarnethylgermanium(TMG) were exposed to y radiation from a 60Co source up to dose 579Gray and 902Gray, respectively. The electron lifetimes and the free ion yields were measured as a function of accumulated radiation dose. A similar behavior of the electron lifetimes and the free ion yields with increasing radiation dose was observed between the TMS and TMG ionization chambers.

Original languageEnglish
Pages (from-to)853-855
Number of pages3
JournalIEEE Transactions on Nuclear Science
Volume41
Issue number4
DOIs
Publication statusPublished - 1994 Aug

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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