Quick X-ray reflectometry in the simultaneous multiple angle-wavelength dispersive mode

E. Arakawa, W. Voegeli, T. Matsushita, Y. F. Yano, T. Hatano

Research output: Contribution to journalConference articlepeer-review

5 Citations (Scopus)

Abstract

The whole profile of the specular X-ray reflectivity curve was simultaneously and quickly measured with no need to rotate the specimen, the detector or the monochromator crystal. A white synchrotron beam from a bending magnet source is incident on a bent-twisted silicon (111) crystal polychromator that produces a convergent X-ray beam with a continuously varying wavelength (energy) and glancing angle to the specimen surface. This convergent X-ray beam was specularly reflected in the vertical direction by the specimen placed at the focus. The normalized spatial distribution across the beam direction of the reflected beam represents a specular X-ray reflectivity curve because each position along the line recorded on the two dimensional detector surface corresponds to a different momentum transfer. Reflectivity curves from a (001) silicon wafer, a nickel thin film on a silicon substrate, and a water surface were measured with data collection times of 0.001-100 s, 0.01-100 s, and 1.0-1000 s, respectively. The simultaneously covered momentum transfer range was 0.03-0.52 Å-1 for solid specimens and 0-0.41 Å-1 for liquid specimen.

Original languageEnglish
Article number092002
JournalJournal of Physics: Conference Series
Volume425
Issue numberPART 9
DOIs
Publication statusPublished - 2013
Event11th International Conference on Synchrotron Radiation Instrumentation, SRI 2012 - Lyon, France
Duration: 2012 Jul 92012 Jul 13

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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