Abstract
In this paper, we propose a new MFM (Magnetic Force Microscopy) method to analyze the probability and size of partial erasure (PE). An analysis classifying the linear and nonlinear partial erasure is also proposed. It was realized that the nonlinear PE is correlated with the inter-granular magnetic coupling in thin film media. The isolation of the magnetic coupling was found effective to reduce the nonlinear PE.
Original language | English |
---|---|
Pages (from-to) | 1973-1975 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 34 |
Issue number | 4 pt 1 |
DOIs | |
Publication status | Published - 1998 Jul 1 |
Externally published | Yes |
Event | Proceedings of the 1998 7th Joint Magnetism and Magnetic Materials - International Magnetics Conference. Part 1 (of 2) - San Francisco, CA, USA Duration: 1998 Jan 6 → 1998 Jan 9 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Physics and Astronomy (miscellaneous)