Quantitative measurement of linear dielectric constant using scanning nonlinear dielectric microscopy with electro-conductive cantilever

Koya Ohara, Yasuo Cho

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

A quantitative measurement of linear dielectric constant was conducted using a scanning nonlinear dielectric microscopy (SNDM) with electro-conductive cantilever. The average value of the linear dielectric constant of the specimen in the area was obtained under the beam of the cantilever using a measured standard curve. The tip sensitivity of the cantilever was calibrated using the standard sample with the macroscopic distribution of the linear dielectric constant. Using the calibration data, the dielectric check distribution of TiO2-Bi2Ti4O11 ceramics was measured quantitatively.

Original languageEnglish
Pages (from-to)4961-4964
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume41
Issue number7 B
Publication statusPublished - 2002 Jul 1

Keywords

  • Linear dielectric constant
  • Quantitative measurement
  • Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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