Abstract
The theory for quantitative measurement of linear and nonlinear dielectric constants using scanning nonlinear dielectric microscopy is explained in this paper. Using this theory, quantitative measurements for linear and nonlinear dielectric constants of dielectric materials were performed successfully.
| Original language | English |
|---|---|
| Pages (from-to) | 3086-3089 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 39 |
| Issue number | 5 B |
| Publication status | Published - 2000 Dec 1 |
Keywords
- Linear dielectric constant
- Nonlinear dielectric constant
- Quantitative measurement
- Scanning nonlinear dielectric microscopy
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)