Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy

Yasuo Cho, Satoshi Kazuta, Koya Ohara, Hiroyuki Odagawa

Research output: Contribution to journalArticlepeer-review

35 Citations (Scopus)

Abstract

The theory for quantitative measurement of linear and nonlinear dielectric constants using scanning nonlinear dielectric microscopy is explained in this paper. Using this theory, quantitative measurements for linear and nonlinear dielectric constants of dielectric materials were performed successfully.

Original languageEnglish
Pages (from-to)3086-3089
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume39
Issue number5 B
Publication statusPublished - 2000 Dec 1

Keywords

  • Linear dielectric constant
  • Nonlinear dielectric constant
  • Quantitative measurement
  • Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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