Quantitative measurement of dielectric properties using scanning nonlinear dielectric microscopy with electro-conductive cantilever

Koya Ohara, Yasuo Cho

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A quantitative measurement method of the linear and nonlinear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO2-Bi2Ti 4O11 ceramics and nonlinear dielectric constant of LiTaO3 single crystal.

Original languageEnglish
Pages (from-to)209-217
Number of pages9
JournalIntegrated Ferroelectrics
Volume50
DOIs
Publication statusPublished - 2002 Dec 1

Keywords

  • Linear dielectric constant
  • Nonlinear dielectric constant
  • Quantitative measurement
  • Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

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