Abstract
A quantitative measurement method of the linear and nonlinear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO2-Bi2Ti 4O11 ceramics and nonlinear dielectric constant of LiTaO3 single crystal.
Original language | English |
---|---|
Pages (from-to) | 209-217 |
Number of pages | 9 |
Journal | Integrated Ferroelectrics |
Volume | 50 |
DOIs | |
Publication status | Published - 2002 Dec 1 |
Keywords
- Linear dielectric constant
- Nonlinear dielectric constant
- Quantitative measurement
- Scanning nonlinear dielectric microscopy
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Physics and Astronomy (miscellaneous)
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials