Quantitative measurement of dielectric properties using scanning nonlinear dielectric microscopy with electro-conductive cantilever

Koya Ohara; Yasuo Cho

doi:10.1080/10584580215512

Quantitative measurement of dielectric properties using scanning nonlinear dielectric microscopy with electro-conductive cantilever

Koya Ohara, Yasuo Cho

Information Devices Division

Research output: Contribution to journal › Article

1 Citation (Scopus)

Abstract

A quantitative measurement method of the linear and nonlinear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO₂-Bi₂Ti ₄O₁₁ ceramics and nonlinear dielectric constant of LiTaO₃ single crystal.

Original language	English
Pages (from-to)	209-217
Number of pages	9
Journal	Integrated Ferroelectrics
Volume	50
DOIs	https://doi.org/10.1080/10584580215512
Publication status	Published - 2002 Dec 1

Keywords

Linear dielectric constant
Nonlinear dielectric constant
Quantitative measurement
Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

Electrical and Electronic Engineering
Physics and Astronomy (miscellaneous)
Condensed Matter Physics
Electronic, Optical and Magnetic Materials

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10.1080/10584580215512

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abstract = "A quantitative measurement method of the linear and nonlinear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO2-Bi2Ti 4O11 ceramics and nonlinear dielectric constant of LiTaO3 single crystal.",

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