Quantitative high-resolution electron microscopy of a high-Tc superconductor Tl2Ba2Cu1Oy with the imaging plate

D. Shindo, T. Oku, J. Kudoh, T. Oikawa

Research output: Contribution to journalArticlepeer-review

36 Citations (Scopus)


A high-resolution electron microscope image of the high-Tc superconductor Tl2Ba2Cu1Oy was quantitatively observed by using the imaging plate. In order to quantitatively evaluate the difference between the intensity of the observed image and that of calculated images, a residual index RHREM (= Σ|Iobs - Ical |/ΣIobs) was calcu lated for 743 sampling points in the unit cell projected along the [010] direction. Although it has a rather complicated layered structure, RHREM = 0.0473 was obtained by choosing the experimental parameters and taking into account the partial occupancy of Tl atoms. Based on the analysis of the high-resolution electron microscope image of Tl2Ba2Cu1Oy, several requirements for further refinement of crystal structure analysis by quantitative high-resolution microscopy were discussed.

Original languageEnglish
Pages (from-to)221-228
Number of pages8
Issue number2-4
Publication statusPublished - 1994 Jun

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Fingerprint Dive into the research topics of 'Quantitative high-resolution electron microscopy of a high-T<sub>c</sub> superconductor Tl<sub>2</sub>Ba<sub>2</sub>Cu<sub>1</sub>O<sub>y</sub> with the imaging plate'. Together they form a unique fingerprint.

Cite this