A high-resolution electron microscope image of the high-Tc superconductor Tl2Ba2Cu1Oy was quantitatively observed by using the imaging plate. In order to quantitatively evaluate the difference between the intensity of the observed image and that of calculated images, a residual index RHREM (= Σ|Iobs - Ical |/ΣIobs) was calcu lated for 743 sampling points in the unit cell projected along the  direction. Although it has a rather complicated layered structure, RHREM = 0.0473 was obtained by choosing the experimental parameters and taking into account the partial occupancy of Tl atoms. Based on the analysis of the high-resolution electron microscope image of Tl2Ba2Cu1Oy, several requirements for further refinement of crystal structure analysis by quantitative high-resolution microscopy were discussed.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics