TY - JOUR
T1 - Quantitative evaluation of magnetocrystalline anisotropy of columnar grains and thickness of initial layer in CoCr-based perpendicular media
AU - Saito, Shin
AU - Hasegawa, Daiji
AU - Hoshi, Fumikazu
AU - Djayaprawira, David D.
AU - Takahashi, Migaku
PY - 2002/2/4
Y1 - 2002/2/4
N2 - We propose a quantitative analysis using perpendicular torquemetry to evaluate the thickness of the initial layer which consists of nanocrystalline grains, whose c axes are three-dimensionally randomly oriented, and the intrinsic magnetocrystalline anisotropy of the columnar grains with its c plane parallel to the film plane for CoCr-based perpendicular thin-film media. By applying this analysis to CoNiCrTa, CoCrPtTa, and CoCrPtB media, we found that the initial layer can be completely removed in the CoCrPtB medium epitaxially grown on an hcp-structured Co60Cr40 intermediate layer.
AB - We propose a quantitative analysis using perpendicular torquemetry to evaluate the thickness of the initial layer which consists of nanocrystalline grains, whose c axes are three-dimensionally randomly oriented, and the intrinsic magnetocrystalline anisotropy of the columnar grains with its c plane parallel to the film plane for CoCr-based perpendicular thin-film media. By applying this analysis to CoNiCrTa, CoCrPtTa, and CoCrPtB media, we found that the initial layer can be completely removed in the CoCrPtB medium epitaxially grown on an hcp-structured Co60Cr40 intermediate layer.
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U2 - 10.1063/1.1445467
DO - 10.1063/1.1445467
M3 - Article
AN - SCOPUS:79956035021
SN - 0003-6951
VL - 80
SP - 811
EP - 813
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 5
ER -