Quantitative electron microscopy with imaging plate

D. Shindo

    Research output: Contribution to conferencePaperpeer-review

    Abstract

    Quantitative analysis of electron diffraction patterns and high-resolution electron microscope (HREM) images was conducted using the image processing system PIXsysTEM and the main frame ACOS3900. The observed intensity and calculated intensity were compared with consideration of crystal thickness and defocus value. A residual index was calculated and correlated with the experimental parameters. It was concluded that a higher resolution limit and a smaller residual index are necessary to get more accurate atomic arrangements from HREM images observed in the imaging plate.

    Original languageEnglish
    Pages408-409
    Number of pages2
    Publication statusPublished - 1994 Dec 1
    EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
    Duration: 1994 Jul 311994 Aug 5

    Other

    OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
    CityNew Orleans, LA, USA
    Period94/7/3194/8/5

    ASJC Scopus subject areas

    • Engineering(all)

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