Quantitative determination of the atomic scattering tensor in orbitally ordered (formula presented) by using a resonant x-ray scattering technique

H. Nakao, Y. Wakabayashi, T. Kiyama, Y. Murakami, M. V. Zimmermann, J. P. Hill, Doon Gibbs, S. Ishihara, Y. Taguchi, Y. Tokura

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The orbitally ordered state of (formula presented) has been investigated utilizing resonant x-ray scattering (RXS) near the Ti K-edge. The RXS intensities have been observed at the (formula presented) dipole transition energy (the main edge). The atomic scattering tensor of the Ti ion has quantitatively been determined by measurements of the azimuthal angle and polarization dependence of the signal at several scattering vectors. On the basis of the tensor, we discuss not only the scattering mechanism but also the wave function of the orbitally ordered state, finding it to be a linear combination of two (formula presented) transition energy (the pre-edge) was also observed. This signal was found to have the same azimuthal angle and polarization dependence as that at the main edge.

Original languageEnglish
Pages (from-to)1-7
Number of pages7
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume66
Issue number18
DOIs
Publication statusPublished - 2002 Jan 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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