Quantitative determination of the atomic scattering tensor in orbitally ordered (formula presented) by using a resonant x-ray scattering technique

H. Nakao; Y. Wakabayashi; T. Kiyama; Y. Murakami; M. V. Zimmermann; J. P. Hill; Doon Gibbs; S. Ishihara; Y. Taguchi; Y. Tokura

doi:10.1103/PhysRevB.66.184419

Quantitative determination of the atomic scattering tensor in orbitally ordered (formula presented) by using a resonant x-ray scattering technique

H. Nakao, Y. Wakabayashi, T. Kiyama, Y. Murakami, M. V. Zimmermann, J. P. Hill, Doon Gibbs, S. Ishihara, Y. Taguchi, Y. Tokura

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

The orbitally ordered state of (formula presented) has been investigated utilizing resonant x-ray scattering (RXS) near the Ti K-edge. The RXS intensities have been observed at the (formula presented) dipole transition energy (the main edge). The atomic scattering tensor of the Ti ion has quantitatively been determined by measurements of the azimuthal angle and polarization dependence of the signal at several scattering vectors. On the basis of the tensor, we discuss not only the scattering mechanism but also the wave function of the orbitally ordered state, finding it to be a linear combination of two (formula presented) transition energy (the pre-edge) was also observed. This signal was found to have the same azimuthal angle and polarization dependence as that at the main edge.

Original language	English
Pages (from-to)	1-7
Number of pages	7
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	66
Issue number	18
DOIs	https://doi.org/10.1103/PhysRevB.66.184419
Publication status	Published - 2002
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.66.184419

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Nakao, H., Wakabayashi, Y., Kiyama, T., Murakami, Y., Zimmermann, M. V., Hill, J. P., Gibbs, D., Ishihara, S., Taguchi, Y., & Tokura, Y. (2002). Quantitative determination of the atomic scattering tensor in orbitally ordered (formula presented) by using a resonant x-ray scattering technique. Physical Review B - Condensed Matter and Materials Physics, 66(18), 1-7. https://doi.org/10.1103/PhysRevB.66.184419

Nakao, H, Wakabayashi, Y, Kiyama, T, Murakami, Y, Zimmermann, MV, Hill, JP, Gibbs, D, Ishihara, S, Taguchi, Y & Tokura, Y 2002, 'Quantitative determination of the atomic scattering tensor in orbitally ordered (formula presented) by using a resonant x-ray scattering technique', Physical Review B - Condensed Matter and Materials Physics, vol. 66, no. 18, pp. 1-7. https://doi.org/10.1103/PhysRevB.66.184419

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title = "Quantitative determination of the atomic scattering tensor in orbitally ordered (formula presented) by using a resonant x-ray scattering technique",

abstract = "The orbitally ordered state of (formula presented) has been investigated utilizing resonant x-ray scattering (RXS) near the Ti K-edge. The RXS intensities have been observed at the (formula presented) dipole transition energy (the main edge). The atomic scattering tensor of the Ti ion has quantitatively been determined by measurements of the azimuthal angle and polarization dependence of the signal at several scattering vectors. On the basis of the tensor, we discuss not only the scattering mechanism but also the wave function of the orbitally ordered state, finding it to be a linear combination of two (formula presented) transition energy (the pre-edge) was also observed. This signal was found to have the same azimuthal angle and polarization dependence as that at the main edge.",

author = "H. Nakao and Y. Wakabayashi and T. Kiyama and Y. Murakami and Zimmermann, {M. V.} and Hill, {J. P.} and Doon Gibbs and S. Ishihara and Y. Taguchi and Y. Tokura",

year = "2002",

doi = "10.1103/PhysRevB.66.184419",

language = "English",

volume = "66",

pages = "1--7",

journal = "Physical Review B - Condensed Matter and Materials Physics",

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T1 - Quantitative determination of the atomic scattering tensor in orbitally ordered (formula presented) by using a resonant x-ray scattering technique

AU - Nakao, H.

AU - Wakabayashi, Y.

AU - Kiyama, T.

AU - Murakami, Y.

AU - Zimmermann, M. V.

AU - Hill, J. P.

AU - Gibbs, Doon

AU - Ishihara, S.

AU - Taguchi, Y.

AU - Tokura, Y.

PY - 2002

Y1 - 2002

N2 - The orbitally ordered state of (formula presented) has been investigated utilizing resonant x-ray scattering (RXS) near the Ti K-edge. The RXS intensities have been observed at the (formula presented) dipole transition energy (the main edge). The atomic scattering tensor of the Ti ion has quantitatively been determined by measurements of the azimuthal angle and polarization dependence of the signal at several scattering vectors. On the basis of the tensor, we discuss not only the scattering mechanism but also the wave function of the orbitally ordered state, finding it to be a linear combination of two (formula presented) transition energy (the pre-edge) was also observed. This signal was found to have the same azimuthal angle and polarization dependence as that at the main edge.

AB - The orbitally ordered state of (formula presented) has been investigated utilizing resonant x-ray scattering (RXS) near the Ti K-edge. The RXS intensities have been observed at the (formula presented) dipole transition energy (the main edge). The atomic scattering tensor of the Ti ion has quantitatively been determined by measurements of the azimuthal angle and polarization dependence of the signal at several scattering vectors. On the basis of the tensor, we discuss not only the scattering mechanism but also the wave function of the orbitally ordered state, finding it to be a linear combination of two (formula presented) transition energy (the pre-edge) was also observed. This signal was found to have the same azimuthal angle and polarization dependence as that at the main edge.

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JO - Physical Review B - Condensed Matter and Materials Physics

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SN - 0163-1829

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Quantitative determination of the atomic scattering tensor in orbitally ordered (formula presented) by using a resonant x-ray scattering technique

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