Quantitative determination of site occupancy of multi-rare-earth elements doped into Ca2SnO4 phosphor by electron channeling microanalysis

Y. Fujimichi, S. Muto, K. Tatsumi, T. Kawano, H. Yamane

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)

    Abstract

    X-ray fluorescence analysis based on electron channeling effects in transmission electron microscopy (TEM) was performed on Ca2SnO 4 phosphor materials doped with Eu3/Y3 at various concentrations, which showed red photoluminescence associated with the 5D07F2 electric dipole transition of Eu3 ions. The method provided direct information on which host element site dopant elements occupy, the results of which were compared with those of X-ray diffraction (XRD)Rietveld analysis. The obtained results indicated that while it is not favorable for a part of Eu3 to occupy the smaller Sn4 site, this is still energetically better than creating Ca vacancies or any other of the possible charge balance mechanisms. The local lattice distortions associated with dopant impurities with different ionic radii were also examined by TEMelectron energy-loss spectroscopy (TEMEELS). The change in PL intensity as a function of dopant concentration is discussed based on the experimental results, although the general concept of concentration quenching applies.

    Original languageEnglish
    Pages (from-to)2127-2132
    Number of pages6
    JournalJournal of Solid State Chemistry
    Volume183
    Issue number9
    DOIs
    Publication statusPublished - 2010 Sep

    Keywords

    • Electron channeling
    • Electron energy-loss spectroscopy
    • Energy-dispersive X-ray analysis
    • Rare-earth dopant
    • Transmission electron microscopy

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Ceramics and Composites
    • Condensed Matter Physics
    • Physical and Theoretical Chemistry
    • Inorganic Chemistry
    • Materials Chemistry

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