Quantification in high-resolution electron microscopy with the imaging plate

Daisuke Shindo, K. Hiraga, T. Oku, T. Oikawa

    Research output: Contribution to journalArticlepeer-review

    17 Citations (Scopus)


    By making good use of the excellent properties of the imaging plate (IP), i.e., high sensitivity, a wide dynamic range and good linearity for electron intensity, high-resolution electron microscope (HREM) images were quantitatively analyzed. In W8Ta2O29, contrast changes due to the dynamical diffraction effect were quantitatively evaluated and compared with the simulated images. In Pb(Ba, Sr)2(Eu, Ce)2Cu3Oy, which is related to high-Tc superconductors, atomic columns containing heavy elements such as Pb were clearly distinguished from those of relatively light elements such as Cu. Furthermore, quantitatively evaluated contour maps revealed vacant oxygen positions, which are important in characterization of both the structure and the electrical properties of the high-Tc superconductors. These results demonstrate that the IP is effective and indispensable for the quantitative analysis of HREM images as well as for electron diffraction patterns.

    Original languageEnglish
    Pages (from-to)50-57
    Number of pages8
    Issue number1-4
    Publication statusPublished - 1991 Nov 2

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Instrumentation


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