Publisher's Note: "Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator" [(Appl. Phys. Lett. 87, 133114 (2005)]

Toshu An; Toyoaki Eguchi; Kotone Akiyama; Yukio Hasegawa

doi:10.1063/1.2168156

Publisher's Note: "Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator" [(Appl. Phys. Lett. 87, 133114 (2005)]

Toshu An, Toyoaki Eguchi, Kotone Akiyama, Yukio Hasegawa

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Article number	149903
Journal	Applied Physics Letters
Volume	88
Issue number	14
DOIs	https://doi.org/10.1063/1.2168156
Publication status	Published - 2006 Apr 3
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2168156

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Publisher's Note : "Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator" [(Appl. Phys. Lett. 87, 133114 (2005)]. / An, Toshu; Eguchi, Toyoaki; Akiyama, Kotone et al.

In: Applied Physics Letters, Vol. 88, No. 14, 149903, 03.04.2006.

Research output: Contribution to journal › Comment/debate › peer-review

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Publisher's Note: "Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator" [(Appl. Phys. Lett. 87, 133114 (2005)]

ASJC Scopus subject areas

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