PTRF X-ray absorption fine structure as a new technique for catalyst characterization

W. J. Chun; M. Shirai; K. Tomishige; K. Asakura; Y. Iwasawa

doi:10.1016/1381-1169(95)00163-8

PTRF X-ray absorption fine structure as a new technique for catalyst characterization

W. J. Chun, M. Shirai, K. Tomishige, K. Asakura, Y. Iwasawa

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

A chamber for observation in situ of polarized total-reflection fluorescence extended X-ray absorption fine structure (PTRF-XAFS) spectra was constructed, which makes it possible to measure the PTRF-XAFS spectra in situ under preparation, treatment, and reaction conditions from high vacuum( 1×10^-9 Pa) to high pressure( 1×10⁵Pa) and from low temperature(100 K) to high temperature(800 K). The PTRF-XAFS technique can provide information on asymmetric or anisotropic structure of active metal and metal-oxide sites supported on single crystal substrates as models for supported catalysts, by measuring bondings of supported species in two or three different directions parallel and perpendicular to the surface independently. Typical EXAFS and XANES spectra for Cu²⁺/α-SiO₂ (0001), CoO_x/α-Al₂O₃ (0001), [Pt]₄/α-Al₂O₃ (0001), and V₂O₅/ZrO₂ (100) taken by the PTRF-XAFS chamber are discussed in relation to their catalytic properties.

Original language	English
Pages (from-to)	55-65
Number of pages	11
Journal	Journal of Molecular Catalysis A: Chemical
Volume	107
Issue number	1-3
DOIs	https://doi.org/10.1016/1381-1169(95)00163-8
Publication status	Published - 1996 Jan 1
Externally published	Yes

Keywords

Anisotropic structure analysis
Asymmetric structure analysis
Chamber in situ XAFS
Orientation of surface bonds
Surfaces
X-ray absorption fine structure (XAFS)

ASJC Scopus subject areas

Catalysis
Process Chemistry and Technology
Physical and Theoretical Chemistry

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10.1016/1381-1169(95)00163-8

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title = "PTRF X-ray absorption fine structure as a new technique for catalyst characterization",

abstract = "A chamber for observation in situ of polarized total-reflection fluorescence extended X-ray absorption fine structure (PTRF-XAFS) spectra was constructed, which makes it possible to measure the PTRF-XAFS spectra in situ under preparation, treatment, and reaction conditions from high vacuum( 1×10-9 Pa) to high pressure( 1×105Pa) and from low temperature(100 K) to high temperature(800 K). The PTRF-XAFS technique can provide information on asymmetric or anisotropic structure of active metal and metal-oxide sites supported on single crystal substrates as models for supported catalysts, by measuring bondings of supported species in two or three different directions parallel and perpendicular to the surface independently. Typical EXAFS and XANES spectra for Cu2+/α-SiO2 (0001), CoOx/α-Al2O3 (0001), [Pt]4/α-Al2O3 (0001), and V2O5/ZrO2 (100) taken by the PTRF-XAFS chamber are discussed in relation to their catalytic properties.",

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author = "Chun, {W. J.} and M. Shirai and K. Tomishige and K. Asakura and Y. Iwasawa",

year = "1996",

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doi = "10.1016/1381-1169(95)00163-8",

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T1 - PTRF X-ray absorption fine structure as a new technique for catalyst characterization

AU - Chun, W. J.

AU - Shirai, M.

AU - Tomishige, K.

AU - Asakura, K.

AU - Iwasawa, Y.

PY - 1996/1/1

Y1 - 1996/1/1

N2 - A chamber for observation in situ of polarized total-reflection fluorescence extended X-ray absorption fine structure (PTRF-XAFS) spectra was constructed, which makes it possible to measure the PTRF-XAFS spectra in situ under preparation, treatment, and reaction conditions from high vacuum( 1×10-9 Pa) to high pressure( 1×105Pa) and from low temperature(100 K) to high temperature(800 K). The PTRF-XAFS technique can provide information on asymmetric or anisotropic structure of active metal and metal-oxide sites supported on single crystal substrates as models for supported catalysts, by measuring bondings of supported species in two or three different directions parallel and perpendicular to the surface independently. Typical EXAFS and XANES spectra for Cu2+/α-SiO2 (0001), CoOx/α-Al2O3 (0001), [Pt]4/α-Al2O3 (0001), and V2O5/ZrO2 (100) taken by the PTRF-XAFS chamber are discussed in relation to their catalytic properties.

AB - A chamber for observation in situ of polarized total-reflection fluorescence extended X-ray absorption fine structure (PTRF-XAFS) spectra was constructed, which makes it possible to measure the PTRF-XAFS spectra in situ under preparation, treatment, and reaction conditions from high vacuum( 1×10-9 Pa) to high pressure( 1×105Pa) and from low temperature(100 K) to high temperature(800 K). The PTRF-XAFS technique can provide information on asymmetric or anisotropic structure of active metal and metal-oxide sites supported on single crystal substrates as models for supported catalysts, by measuring bondings of supported species in two or three different directions parallel and perpendicular to the surface independently. Typical EXAFS and XANES spectra for Cu2+/α-SiO2 (0001), CoOx/α-Al2O3 (0001), [Pt]4/α-Al2O3 (0001), and V2O5/ZrO2 (100) taken by the PTRF-XAFS chamber are discussed in relation to their catalytic properties.

KW - Anisotropic structure analysis

KW - Asymmetric structure analysis

KW - Chamber in situ XAFS

KW - Orientation of surface bonds

KW - Surfaces

KW - X-ray absorption fine structure (XAFS)

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PTRF X-ray absorption fine structure as a new technique for catalyst characterization

Abstract

Keywords

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