PTRF X-ray absorption fine structure as a new technique for catalyst characterization

W. J. Chun, M. Shirai, K. Tomishige, K. Asakura, Y. Iwasawa

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

A chamber for observation in situ of polarized total-reflection fluorescence extended X-ray absorption fine structure (PTRF-XAFS) spectra was constructed, which makes it possible to measure the PTRF-XAFS spectra in situ under preparation, treatment, and reaction conditions from high vacuum( 1×10-9 Pa) to high pressure( 1×105Pa) and from low temperature(100 K) to high temperature(800 K). The PTRF-XAFS technique can provide information on asymmetric or anisotropic structure of active metal and metal-oxide sites supported on single crystal substrates as models for supported catalysts, by measuring bondings of supported species in two or three different directions parallel and perpendicular to the surface independently. Typical EXAFS and XANES spectra for Cu2+/α-SiO2 (0001), CoOx/α-Al2O3 (0001), [Pt]4/α-Al2O3 (0001), and V2O5/ZrO2 (100) taken by the PTRF-XAFS chamber are discussed in relation to their catalytic properties.

Original languageEnglish
Pages (from-to)55-65
Number of pages11
JournalJournal of Molecular Catalysis A: Chemical
Volume107
Issue number1-3
DOIs
Publication statusPublished - 1996 Jan 1
Externally publishedYes

Keywords

  • Anisotropic structure analysis
  • Asymmetric structure analysis
  • Chamber in situ XAFS
  • Orientation of surface bonds
  • Surfaces
  • X-ray absorption fine structure (XAFS)

ASJC Scopus subject areas

  • Catalysis
  • Process Chemistry and Technology
  • Physical and Theoretical Chemistry

Fingerprint Dive into the research topics of 'PTRF X-ray absorption fine structure as a new technique for catalyst characterization'. Together they form a unique fingerprint.

Cite this