Prospects for 3D imaging of dopant atoms in ceramic interfaces

Scott D. Findlay; Naoya Shibata; Shinya Azuma; Yuichi Ikuhara

doi:10.1093/jmicro/dfq029

Prospects for 3D imaging of dopant atoms in ceramic interfaces

Scott D. Findlay, Naoya Shibata, Shinya Azuma, Yuichi Ikuhara

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Expanding upon recent experimental results for a Y-doped Σ13 α-Al₂O₃ grain boundary, we explore through simulation the extent to which plan-view imaging of buried interfaces may be possible (cf. the more usual cross-section imaging). As we show in detail, that case was significantly aided by the normal to the interface plane being a high-order zone axis orientation, giving the visibility of the Y atoms a remarkable insensitivity to the specimen thickness and the depth of the interface plane. The visibility along lower order zone axis orientations and the visibility of different dopant species are discussed.

Original language	English
Pages (from-to)	S29-S38
Journal	Journal of Electron Microscopy
Volume	59
Issue number	SUPPL. 1
DOIs	https://doi.org/10.1093/jmicro/dfq029
Publication status	Published - 2010 Aug

Keywords

3D imaging
HAADF imaging
STEM
ceramics
dopant atoms
interface structure

ASJC Scopus subject areas

Instrumentation

Access to Document

10.1093/jmicro/dfq029

Cite this

@article{6988a78dd97b4ad68e97ae449abfeeea,

title = "Prospects for 3D imaging of dopant atoms in ceramic interfaces",

abstract = "Expanding upon recent experimental results for a Y-doped Σ13 α-Al2O3 grain boundary, we explore through simulation the extent to which plan-view imaging of buried interfaces may be possible (cf. the more usual cross-section imaging). As we show in detail, that case was significantly aided by the normal to the interface plane being a high-order zone axis orientation, giving the visibility of the Y atoms a remarkable insensitivity to the specimen thickness and the depth of the interface plane. The visibility along lower order zone axis orientations and the visibility of different dopant species are discussed.",

keywords = "3D imaging, HAADF imaging, STEM, ceramics, dopant atoms, interface structure",

author = "Findlay, {Scott D.} and Naoya Shibata and Shinya Azuma and Yuichi Ikuhara",

note = "Funding Information: This work was supported in part by the Grant-in-Aid for Scientific Research on Priority Areas {\textquoteleft}Nano Materials Science for Atomic-scale Modification 474{\textquoteright} from the Ministry of Education, Culture, Sports and Technology Japan (MEXT). N.S. acknowledges support from PRESTO, Japan Science and Technology Agency; the Industrial Technology Research Grant Program in 2007 from the New Energy and Industrial Technology Development Organization (NEDO); and the Grant-in-Aid for Young Scientists (A) (20686042) from MEXT. S.D.F. is supported by the Japan Society for the Promotion of Science (JSPS).",

year = "2010",

month = aug,

doi = "10.1093/jmicro/dfq029",

language = "English",

volume = "59",

pages = "S29--S38",

journal = "Microscopy (Oxford, England)",

issn = "2050-5698",

publisher = "Japanese Society of Microscopy",

number = "SUPPL. 1",

}

TY - JOUR

T1 - Prospects for 3D imaging of dopant atoms in ceramic interfaces

AU - Findlay, Scott D.

AU - Shibata, Naoya

AU - Azuma, Shinya

AU - Ikuhara, Yuichi

N1 - Funding Information: This work was supported in part by the Grant-in-Aid for Scientific Research on Priority Areas ‘Nano Materials Science for Atomic-scale Modification 474’ from the Ministry of Education, Culture, Sports and Technology Japan (MEXT). N.S. acknowledges support from PRESTO, Japan Science and Technology Agency; the Industrial Technology Research Grant Program in 2007 from the New Energy and Industrial Technology Development Organization (NEDO); and the Grant-in-Aid for Young Scientists (A) (20686042) from MEXT. S.D.F. is supported by the Japan Society for the Promotion of Science (JSPS).

PY - 2010/8

Y1 - 2010/8

N2 - Expanding upon recent experimental results for a Y-doped Σ13 α-Al2O3 grain boundary, we explore through simulation the extent to which plan-view imaging of buried interfaces may be possible (cf. the more usual cross-section imaging). As we show in detail, that case was significantly aided by the normal to the interface plane being a high-order zone axis orientation, giving the visibility of the Y atoms a remarkable insensitivity to the specimen thickness and the depth of the interface plane. The visibility along lower order zone axis orientations and the visibility of different dopant species are discussed.

AB - Expanding upon recent experimental results for a Y-doped Σ13 α-Al2O3 grain boundary, we explore through simulation the extent to which plan-view imaging of buried interfaces may be possible (cf. the more usual cross-section imaging). As we show in detail, that case was significantly aided by the normal to the interface plane being a high-order zone axis orientation, giving the visibility of the Y atoms a remarkable insensitivity to the specimen thickness and the depth of the interface plane. The visibility along lower order zone axis orientations and the visibility of different dopant species are discussed.

KW - 3D imaging

KW - HAADF imaging

KW - STEM

KW - ceramics

KW - dopant atoms

KW - interface structure

UR - http://www.scopus.com/inward/record.url?scp=77955524310&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77955524310&partnerID=8YFLogxK

U2 - 10.1093/jmicro/dfq029

DO - 10.1093/jmicro/dfq029

M3 - Article

C2 - 20538626

AN - SCOPUS:77955524310

VL - 59

SP - S29-S38

JO - Microscopy (Oxford, England)

JF - Microscopy (Oxford, England)

SN - 2050-5698

IS - SUPPL. 1

ER -

Prospects for 3D imaging of dopant atoms in ceramic interfaces

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this