Prospects for 3D imaging of dopant atoms in ceramic interfaces

Scott D. Findlay, Naoya Shibata, Shinya Azuma, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)

    Abstract

    Expanding upon recent experimental results for a Y-doped Σ13 α-Al2O3 grain boundary, we explore through simulation the extent to which plan-view imaging of buried interfaces may be possible (cf. the more usual cross-section imaging). As we show in detail, that case was significantly aided by the normal to the interface plane being a high-order zone axis orientation, giving the visibility of the Y atoms a remarkable insensitivity to the specimen thickness and the depth of the interface plane. The visibility along lower order zone axis orientations and the visibility of different dopant species are discussed.

    Original languageEnglish
    Pages (from-to)S29-S38
    JournalJournal of Electron Microscopy
    Volume59
    Issue numberSUPPL. 1
    DOIs
    Publication statusPublished - 2010 Aug

    Keywords

    • 3D imaging
    • HAADF imaging
    • STEM
    • ceramics
    • dopant atoms
    • interface structure

    ASJC Scopus subject areas

    • Instrumentation

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