Abstract
Expanding upon recent experimental results for a Y-doped Σ13 α-Al2O3 grain boundary, we explore through simulation the extent to which plan-view imaging of buried interfaces may be possible (cf. the more usual cross-section imaging). As we show in detail, that case was significantly aided by the normal to the interface plane being a high-order zone axis orientation, giving the visibility of the Y atoms a remarkable insensitivity to the specimen thickness and the depth of the interface plane. The visibility along lower order zone axis orientations and the visibility of different dopant species are discussed.
Original language | English |
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Pages (from-to) | S29-S38 |
Journal | Journal of Electron Microscopy |
Volume | 59 |
Issue number | SUPPL. 1 |
DOIs | |
Publication status | Published - 2010 Aug |
Externally published | Yes |
Keywords
- 3D imaging
- HAADF imaging
- STEM
- ceramics
- dopant atoms
- interface structure
ASJC Scopus subject areas
- Instrumentation