Properties of sputter-deposited Ni-Mn-Ga thin films

V. A. Chernenko, S. Besseghini, M. Hagler, P. Müllner, M. Ohtsuka, F. Stortiero

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

Sub-micrometer Ni-Mn-Ga films on MgO(0 0 1) single-crystalline wafers have been prepared by radio-frequency magnetron sputtering. The structural and magnetic states of the as-received (quasi-amorphous phase) and annealed (highly ordered martensitic phase at T = 300 K) films have been examined by X-ray diffraction, and measurements of resistivity and magnetization. The annealed films demonstrate a transformation behavior typical for the bulk and show a thickness dependence of the magnetic properties.

Original languageEnglish
Pages (from-to)271-274
Number of pages4
JournalMaterials Science and Engineering A
Volume481-482
Issue number1-2 C
DOIs
Publication statusPublished - 2008 May 25

Keywords

  • Magnetic anisotropy
  • Martensitic transformation
  • MgO(0 0 1) wafer
  • Ni-Mn-Ga thin film

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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